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trasnmission monitoting between silicon layer
Posted 23.05.2018, 13:58 GMT-4 Electromagnetics, Semiconductor Devices, Wave Optics 0 Replies
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I had designed a three layered structure. Using PORT 1, I excited the EM wave from the top of the SiO2 and placed second port(PORT 2) at the bottom of Ag(Silver). I had calculated the reflection and transmission of the sample
But in addition to this I want to calculate the reflection and transmission of the Silicon layer(which is placed between the SiO2 and Ag). I had tried to do it with ports but I cant place ports at the first and second boundary as shown in the attached file.
Is their any way to find this(other than by analytical method). Please take a look at the attached figure of my model
Hello Aimal khan
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